A new model to capture security threat patterns by complying with standards and lesson learned - Archiving dependability for security assurance cases

Vaise Patu, Shuichiro Yamamoto. A new model to capture security threat patterns by complying with standards and lesson learned - Archiving dependability for security assurance cases. In IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings. pages 17-18, IEEE, 2013. [doi]

Abstract

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