Raymond A. Paul, Farokh B. Bastani, I-Ling Yen, Venkata U. B. Challagulla. Defect-Based Reliability Analysis for Mission-Critical Software. In 24th International Computer Software and Applications Conference (COMPSAC 2000), 25-28 October 2000, Taipei, Taiwan. pages 439-444, IEEE Computer Society, 2000. [doi]
Abstract is missing.