Topon Kumar Paul, Ken Ueno. Robust Incremental Logistic Regression for Detection of Anomaly Using Big Data. In M. Arif Wani, Feng Luo 0001, Xiaolin Andy Li, Dejing Dou, Francesco Bonchi, editors, 19th IEEE International Conference on Machine Learning and Applications, ICMLA 2020, Miami, FL, USA, December 14-17, 2020. pages 1167-1173, IEEE, 2020. [doi]
Abstract is missing.