Raymond A. Paul, I-Ling Yen, Farokh B. Bastani, Jing Dong, Wei-Tek Tsai, Krishna Kavi, Arif Ghafoor, Jaideep Srivastava. An Ontology-Based Integrated Assessment Framework for High-Assurance Systems. In Proceedings of the 2th IEEE International Conference on Semantic Computing (ICSC 2008), August 4-7, 2008, Santa Clara, California, USA. pages 386-393, IEEE Computer Society, 2008. [doi]
Abstract is missing.