Flavio M. de Paula, Alan J. Hu. EverLost: A Flexible Platform for Industrial-Strength Abstraction-Guided Simulation. In Thomas Ball, Robert B. Jones, editors, Computer Aided Verification, 18th International Conference, CAV 2006, Seattle, WA, USA, August 17-20, 2006, Proceedings. Volume 4144 of Lecture Notes in Computer Science, pages 282-285, Springer, 2006. [doi]
Abstract is missing.