Francesco de Paulis, Stefano Piersanti, Qian Wang, Jonghyun Cho, Nicholas Erickson, Brice Achkir, Jun Fan, James L. Drewniak, Antonio Orlandi. TEM-Like Launch Geometries and Simplified De-embedding for Accurate Through Silicon Via Characterization. IEEE T. Instrumentation and Measurement, 66(4):792-801, 2017. [doi]
Abstract is missing.