Rémi Pautrat, Daniel Barath, Viktor Larsson, Martin R. Oswald, Marc Pollefeys. DeepLSD: Line Segment Detection and Refinement with Deep Image Gradients. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 17327-17336, IEEE, 2023. [doi]
Abstract is missing.