Bohdan Pavlyshenko. Machine learning, linear and Bayesian models for logistic regression in failure detection problems. In James Joshi, George Karypis, Ling Liu, Xiaohua Hu, Ronay Ak, Yinglong Xia, Weijia Xu, Aki-Hiro Sato, Sudarsan Rachuri, Lyle H. Ungar, Philip S. Yu, Rama Govindaraju, Toyotaro Suzumura, editors, 2016 IEEE International Conference on Big Data, BigData 2016, Washington DC, USA, December 5-8, 2016. pages 2046-2050, IEEE, 2016. [doi]
Abstract is missing.