Testing process precision for truncated normal distributions

W. L. Pearn, H. N. Hung, N. F. Peng, C.-Y. Huang. Testing process precision for truncated normal distributions. Microelectronics Reliability, 47(12):2275-2281, 2007. [doi]

Authors

W. L. Pearn

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H. N. Hung

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N. F. Peng

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C.-Y. Huang

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