W. L. Pearn, H. N. Hung, N. F. Peng, C.-Y. Huang. Testing process precision for truncated normal distributions. Microelectronics Reliability, 47(12):2275-2281, 2007. [doi]
@article{PearnHPH07,
title = {Testing process precision for truncated normal distributions},
author = {W. L. Pearn and H. N. Hung and N. F. Peng and C.-Y. Huang},
year = {2007},
doi = {10.1016/j.microrel.2006.12.001},
url = {http://dx.doi.org/10.1016/j.microrel.2006.12.001},
tags = {testing, C++},
researchr = {https://researchr.org/publication/PearnHPH07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {12},
pages = {2275-2281},
}