W. L. Pearn, C. H. Ko, K. H. Wang. A multiprocess performance analysis chart based on the incapability index C::pp::: an application to the chip resistors. Microelectronics Reliability, 42(7):1121-1125, 2002. [doi]
@article{PearnKW02,
title = {A multiprocess performance analysis chart based on the incapability index C::pp::: an application to the chip resistors},
author = {W. L. Pearn and C. H. Ko and K. H. Wang},
year = {2002},
doi = {10.1016/S0026-2714(02)00071-9},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00071-9},
tags = {analysis, C++},
researchr = {https://researchr.org/publication/PearnKW02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {7},
pages = {1121-1125},
}