A multiprocess performance analysis chart based on the incapability index C::pp::: an application to the chip resistors

W. L. Pearn, C. H. Ko, K. H. Wang. A multiprocess performance analysis chart based on the incapability index C::pp::: an application to the chip resistors. Microelectronics Reliability, 42(7):1121-1125, 2002. [doi]

Abstract

Abstract is missing.