Aphinan Peerachaidacho, Nairat Kanyamee, Pinyo Taeprasartsit. Explainable AI for Systematic Detection of Potential Problems in Natural Language Datasets. In 20th IEEE International Joint Conference on Computer Science and Software Engineering, JCSSE 2023, Phitsanulok, Thailand, June 28 - July 1, 2023. pages 139-144, IEEE, 2023. [doi]
Abstract is missing.