Tao Pei, Fan Cheng, Xu Dong Jia, Zhong Hao Li, Hao Guo, Huan Fei Wen, Yan-jun Li, Jun Tang, Jun Liu. High-Resolution Detection of Microwave Fields on Chip Surfaces Based on Scanning Microwave Microscopy. IEEE T. Instrumentation and Measurement, 72:1-6, 2023. [doi]
Abstract is missing.