Songwei Pei, Ye Geng, Huawei Li, Jun Liu, Song Jin. Enhanced LCCG: A novel test clock generation scheme for faster-than-at-speed delay testing. In The 20th Asia and South Pacific Design Automation Conference, ASP-DAC 2015, Chiba, Japan, January 19-22, 2015. pages 514-519, IEEE, 2015. [doi]
Abstract is missing.