Songwei Pei, Huawei Li, Song Jin, Jun Liu, Xiaowei Li 0001. An on-chip frequency programmable test clock generation and application method for small delay defect detection. Integration, 49:87-97, 2015. [doi]
@article{PeiLJL015,
title = {An on-chip frequency programmable test clock generation and application method for small delay defect detection},
author = {Songwei Pei and Huawei Li and Song Jin and Jun Liu and Xiaowei Li 0001},
year = {2015},
doi = {10.1016/j.vlsi.2014.12.003},
url = {http://dx.doi.org/10.1016/j.vlsi.2014.12.003},
researchr = {https://researchr.org/publication/PeiLJL015},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {49},
pages = {87-97},
}