Songwei Pei, Huawei Li, Xiaowei Li. Flip-Flop Selection for Transition Test Pattern Reduction Using Partial Enhanced Scan. In 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009, Shanghai, China, 16-18 November 2009. pages 75-80, IEEE Computer Society, 2009. [doi]
@inproceedings{PeiLL09-0,
title = {Flip-Flop Selection for Transition Test Pattern Reduction Using Partial Enhanced Scan},
author = {Songwei Pei and Huawei Li and Xiaowei Li},
year = {2009},
doi = {10.1109/PRDC.2009.20},
url = {http://doi.ieeecomputersociety.org/10.1109/PRDC.2009.20},
tags = {testing},
researchr = {https://researchr.org/publication/PeiLL09-0},
cites = {0},
citedby = {0},
pages = {75-80},
booktitle = {2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009, Shanghai, China, 16-18 November 2009},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3849-5},
}