A Linear Time Histogram Metric for Improved SIFT Matching

Ofir Pele, Michael Werman. A Linear Time Histogram Metric for Improved SIFT Matching. In David A. Forsyth, Philip H. S. Torr, Andrew Zisserman, editors, Computer Vision - ECCV 2008, 10th European Conference on Computer Vision, Marseille, France, October 12-18, 2008, Proceedings, Part III. Volume 5304 of Lecture Notes in Computer Science, pages 495-508, Springer, 2008. [doi]

Abstract

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