Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor. Case Study: Efficient SDD test generation for very large integrated circuits. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 78-83, IEEE Computer Society, 2011. [doi]
No references recorded for this publication.
No citations of this publication recorded.