EXPERT: EXPloiting DRAM ERror Types to Improve the Effective Forecasting Coverage in the Field

Xiangjun Peng, Zheng Huang, Alex Cantrell, Bihua Shu, Ke Ke Xie, Yi Li, Yu Li, Li Jiang, Qiang Xu, Ming-Chang Yang. EXPERT: EXPloiting DRAM ERror Types to Improve the Effective Forecasting Coverage in the Field. In 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2023 - Supplemental Volume, Porto, Portugal, June 27-30, 2023. pages 35-41, IEEE, 2023. [doi]

@inproceedings{PengHCSXLLJXY23,
  title = {EXPERT: EXPloiting DRAM ERror Types to Improve the Effective Forecasting Coverage in the Field},
  author = {Xiangjun Peng and Zheng Huang and Alex Cantrell and Bihua Shu and Ke Ke Xie and Yi Li and Yu Li and Li Jiang and Qiang Xu and Ming-Chang Yang},
  year = {2023},
  doi = {10.1109/DSN-S58398.2023.00022},
  url = {https://doi.org/10.1109/DSN-S58398.2023.00022},
  researchr = {https://researchr.org/publication/PengHCSXLLJXY23},
  cites = {0},
  citedby = {0},
  pages = {35-41},
  booktitle = {53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2023 - Supplemental Volume, Porto, Portugal, June 27-30, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-2545-4},
}