EXPERT: EXPloiting DRAM ERror Types to Improve the Effective Forecasting Coverage in the Field

Xiangjun Peng, Zheng Huang, Alex Cantrell, Bihua Shu, Ke Ke Xie, Yi Li, Yu Li, Li Jiang, Qiang Xu, Ming-Chang Yang. EXPERT: EXPloiting DRAM ERror Types to Improve the Effective Forecasting Coverage in the Field. In 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2023 - Supplemental Volume, Porto, Portugal, June 27-30, 2023. pages 35-41, IEEE, 2023. [doi]

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