Xuekang Peng, Yisheng Li, Zhichao Lian. Towards Generalizable Forgery Detection Model via Alignment and Fine-tuning. In IEEE International Symposium on Parallel and Distributed Processing with Applications, ISPA 2024, Kaifeng, China, October 30 - Nov. 2, 2024. pages 1623-1628, IEEE, 2024. [doi]
Abstract is missing.