A novel hybrid method for SDD pattern grading and selection

Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. A novel hybrid method for SDD pattern grading and selection. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 45-50, IEEE Computer Society, 2010. [doi]

Authors

Ke Peng

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Jason Thibodeau

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Mahmut Yilmaz

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Krishnendu Chakrabarty

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Mohammad Tehranipoor

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