Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. A novel hybrid method for SDD pattern grading and selection. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 45-50, IEEE Computer Society, 2010. [doi]
Abstract is missing.