Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty. High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 1426-1431, IEEE, 2010. [doi]
@inproceedings{PengYTC10,
title = {High-quality pattern selection for screening small-delay defects considering process variations and crosstalk},
author = {Ke Peng and Mahmut Yilmaz and Mohammad Tehranipoor and Krishnendu Chakrabarty},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5457036},
researchr = {https://researchr.org/publication/PengYTC10},
cites = {0},
citedby = {0},
pages = {1426-1431},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}