A novel RF self test for a combo SoC on digital ATE with multi-site applications

Chun-Hsien Peng, ChiaYu Yang, Adonis Tsu, Chung-Jin Tsai, Yosen Chen, C. Y. Lin, Kai Hong, Kaipon Kao, Paul C. P. Liang, Chao Long Tsai, Charles Chien, H. C. Hwang. A novel RF self test for a combo SoC on digital ATE with multi-site applications. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]

@inproceedings{PengYTTCLHKLTCH14,
  title = {A novel RF self test for a combo SoC on digital ATE with multi-site applications},
  author = {Chun-Hsien Peng and ChiaYu Yang and Adonis Tsu and Chung-Jin Tsai and Yosen Chen and C. Y. Lin and Kai Hong and Kaipon Kao and Paul C. P. Liang and Chao Long Tsai and Charles Chien and H. C. Hwang},
  year = {2014},
  doi = {10.1109/TEST.2014.7035303},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035303},
  researchr = {https://researchr.org/publication/PengYTTCLHKLTCH14},
  cites = {0},
  citedby = {0},
  pages = {1-8},
  booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
  publisher = {IEEE},
  isbn = {978-1-4799-4722-5},
}