Chun-Hsien Peng, ChiaYu Yang, Adonis Tsu, Chung-Jin Tsai, Yosen Chen, C. Y. Lin, Kai Hong, Kaipon Kao, Paul C. P. Liang, Chao Long Tsai, Charles Chien, H. C. Hwang. A novel RF self test for a combo SoC on digital ATE with multi-site applications. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]
Abstract is missing.