Marc Perbost, Ludovic Le Lan, Christian Landrault. Automatic Testability Analysis of Boards and MCMs at Chip Level. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 36-41, IEEE Computer Society, 1997. [doi]
@inproceedings{PerbostLL97,
title = {Automatic Testability Analysis of Boards and MCMs at Chip Level},
author = {Marc Perbost and Ludovic Le Lan and Christian Landrault},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090036abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/PerbostLL97},
cites = {0},
citedby = {0},
pages = {36-41},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}