Miquel Perello-Nieto, Telmo de Menezes e Silva Filho, Meelis Kull, Peter A. Flach. Background Check: A General Technique to Build More Reliable and Versatile Classifiers. In IEEE 16th International Conference on Data Mining, ICDM 2016, December 12-15, 2016, Barcelona, Spain. pages 1143-1148, IEEE, 2016. [doi]
Abstract is missing.