Carlos Perez-Gutierrez, Jesús Alvarez-Mozos, José Martínez-Fernández, Nilda Sánchez. Comparison of a multilateral-based acquisition with Terrestrial Laser Scanner and profilometer technique for soil roughness measurement. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2010, July 25-30, 2010, Honolulu, Hawaii, USA, Proceedings. pages 2988-2991, IEEE, 2010. [doi]
Abstract is missing.