Adrián Pérez-Suay, Francesc J. Ferri, Miguel Arevalillo-Herráez, Jesús V. Albert. About Combining Metric Learning and Prototype Generation. In Pasi Fränti, Gavin Brown, Marco Loog, Francisco Escolano, Marcello Pelillo, editors, Structural, Syntactic, and Statistical Pattern Recognition - Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014. Proceedings. Volume 8621 of Lecture Notes in Computer Science, pages 323-332, Springer, 2014. [doi]
Abstract is missing.