Gilles Perrouin, Sagar Sen, Jacques Klein, Benoit Baudry, Yves Le Traon. Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines. In Third International Conference on Software Testing, Verification and Validation, ICST 2010, Paris, France, April 7-9, 2010. pages 459-468, IEEE Computer Society, 2010. [doi]
Abstract is missing.