R. Petersen, Ward De Ceuninck, Jan D Haen, Marc D Olieslaeger, Luc De Schepper, O. Vendier, H. Blanck, D. Pons. Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectronics Reliability, 42(9-11):1359-1363, 2002. [doi]
Abstract is missing.