Konstantin O. Petrosyants, Igor A. Kharitonov. SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-6, IEEE, 2018. [doi]
@inproceedings{PetrosyantsK18,
title = {SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits},
author = {Konstantin O. Petrosyants and Igor A. Kharitonov},
year = {2018},
doi = {10.1109/EWDTS.2018.8524852},
url = {https://doi.org/10.1109/EWDTS.2018.8524852},
researchr = {https://researchr.org/publication/PetrosyantsK18},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5710-2},
}