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SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits

Konstantin O. Petrosyants, Igor A. Kharitonov. SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-6, IEEE, 2018. [doi]

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