K. O. Petrosyants, I. A. Kharitonov, D. A. Popov. Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{PetrosyantsKP13,
title = {Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU},
author = {K. O. Petrosyants and I. A. Kharitonov and D. A. Popov},
year = {2013},
doi = {10.1109/EWDTS.2013.6673141},
url = {http://dx.doi.org/10.1109/EWDTS.2013.6673141},
researchr = {https://researchr.org/publication/PetrosyantsKP13},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013},
publisher = {IEEE},
}