Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU - researchr publication

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K. O. Petrosyants, I. A. Kharitonov, D. A. Popov. Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]

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