Konstantin O. Petrosyants, N. I. Ryabov, E. I. Batarueva. Compact SPICE Models of the Standard Layout Fragments in LSI Interconnections. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-5, IEEE, 2018. [doi]
Abstract is missing.