Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-zade. Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications. In 2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017. pages 1-8, IEEE Computer Society, 2017. [doi]
Abstract is missing.