Greg Pettyjohn, John Clements, Joe Marshall, Shriram Krishnamurthi, Matthias Felleisen. Continuations from generalized stack inspection. In Olivier Danvy, Benjamin C. Pierce, editors, Proceedings of the 10th ACM SIGPLAN International Conference on Functional Programming, ICFP 2005, Tallinn, Estonia, September 26-28, 2005. pages 216-227, ACM, 2005. [doi]
Abstract is missing.