Kin Leong Pey, A. Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea. Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-12, IEEE, 2019. [doi]
@inproceedings{PeyRRSO19,
title = {Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns},
author = {Kin Leong Pey and A. Ranjan and Nagarajan Raghavan and Kalya Shubhakar and Sean J. O'Shea},
year = {2019},
doi = {10.1109/IRPS.2019.8720405},
url = {https://doi.org/10.1109/IRPS.2019.8720405},
researchr = {https://researchr.org/publication/PeyRRSO19},
cites = {0},
citedby = {0},
pages = {1-12},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}