Temperature control of a handler test interface

Andreas C. Pfahnl, John H. Lienhard V., Alexander H. Slocum. Temperature control of a handler test interface. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 114-118, IEEE Computer Society, 1998. [doi]

Authors

Andreas C. Pfahnl

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John H. Lienhard V.

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Alexander H. Slocum

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