On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults - researchr publication authors

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Petr Pfeifer, Zdenek Plíva. On measurement of impact of the metallization and FPGA design to the changes of slice parameters and generation of delay faults. In Dirk Koch, Satnam Singh, Jim Tørresen, editors, 22nd International Conference on Field Programmable Logic and Applications (FPL), Oslo, Norway, August 29-31, 2012. pages 743-746, IEEE, 2012. [doi]

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