Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola. Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{PhamDM17,
title = {Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data},
author = {Hung V. Pham and Serge N. Demidenko and Giovanni M. Merola},
year = {2017},
doi = {10.1109/I2MTC.2017.7969957},
url = {https://doi.org/10.1109/I2MTC.2017.7969957},
researchr = {https://researchr.org/publication/PhamDM17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017},
publisher = {IEEE},
isbn = {978-1-5090-3596-0},
}