Hung V. Pham, Serge N. Demidenko, Giovanni M. Merola. Eliminating Re-Burn-In in semiconductor manufacturing through statistical analysis of production test data. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.