Quang Vuong Pham, Manh Duy Ngo, Sy Phuong Hoang, Phuong Huy Nguyen, Duc Minh Le, Van Su Luong, Minhhuy Le. Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing. In 12th International Conference on Control, Automation and Information Sciences, ICCAIS 2023, Hanoi, Vietnam, November 27-29, 2023. pages 28-33, IEEE, 2023. [doi]
@inproceedings{PhamNHNLLL23,
title = {Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing},
author = {Quang Vuong Pham and Manh Duy Ngo and Sy Phuong Hoang and Phuong Huy Nguyen and Duc Minh Le and Van Su Luong and Minhhuy Le},
year = {2023},
doi = {10.1109/ICCAIS59597.2023.10382337},
url = {https://doi.org/10.1109/ICCAIS59597.2023.10382337},
researchr = {https://researchr.org/publication/PhamNHNLLL23},
cites = {0},
citedby = {0},
pages = {28-33},
booktitle = {12th International Conference on Control, Automation and Information Sciences, ICCAIS 2023, Hanoi, Vietnam, November 27-29, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2878-3},
}