Quang Vuong Pham, Manh Duy Ngo, Sy Phuong Hoang, Phuong Huy Nguyen, Duc Minh Le, Van Su Luong, Minhhuy Le. Deep Learning-based Thickness Measurement With Pulse Eddy Current Testing. In 12th International Conference on Control, Automation and Information Sciences, ICCAIS 2023, Hanoi, Vietnam, November 27-29, 2023. pages 28-33, IEEE, 2023. [doi]
Abstract is missing.