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Development of fast scanning module with a novel bubble solution applied to scanning acoustic microscopy system for industrial nondestructive inspection

Van Hiep Pham, Tan Hung Vo, Dinh Dat Vu, Jaeyeop Choi, Sumin Park, Sudip Mondal, Byeong Il Lee, Jung-Hwan Oh 0003. Development of fast scanning module with a novel bubble solution applied to scanning acoustic microscopy system for industrial nondestructive inspection. Expert Syst. Appl., 228:120273, October 2023. [doi]

Authors

Van Hiep Pham

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Tan Hung Vo

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Dinh Dat Vu

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Jaeyeop Choi

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Sumin Park

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Sudip Mondal

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Byeong Il Lee

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Jung-Hwan Oh 0003

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