Van Hiep Pham, Tan Hung Vo, Dinh Dat Vu, Jaeyeop Choi, Sumin Park, Sudip Mondal, Byeong Il Lee, Jung-Hwan Oh 0003. Development of fast scanning module with a novel bubble solution applied to scanning acoustic microscopy system for industrial nondestructive inspection. Expert Syst. Appl., 228:120273, October 2023. [doi]
Abstract is missing.