Convolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images - researchr publication authors

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Manop Phankokkruad, Sirirat Wacharawichanant. Convolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images. In 5th International Conference on Computational Science / Intelligence and Applied Informatics, CSII 2018, Yonago, Japan, July 10-12, 2018. pages 27-31, IEEE, 2018. [doi]

This author has not been identified. Look up 'Manop Phankokkruad' in GoogleThis author has not been identified. Look up 'Sirirat Wacharawichanant' in Google

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